Well this works with the patchtool scramble, the Pollock and Vasarely produce same set every time
The Patchtool has this PatchTool SUBSTRATE CORRECTION TOOL.
http://www.babelcolor.com/patchtool_substrate_correction.htm
This tool suposedly uses the method SCCA (Substrate Corrected Colorimetric Aims).
Why not ask the Patchtool author to make feature to virtually scramble the targets? Similar to the VPR for CURVE4.
It's already trivial for me to generate scrambled patches. For instance the following generates CGATs files, and associated iSis tif files for two, concatenated, scrambled rgb patch sets.
rgb1 = sortrows([rgb rand(length(rgb),1)],4);
rgb2 = sortrows([rgb rand(length(rgb),1)],4);
MakeIsis([rgb1(:,1:3); rgb2(:,1:3)], '2X target', 10.5, 7)
This creates both a CGATs file to load into the iSis patch set and associated, formatted and labeled tif file for printing the targets with the patch width set for 10.5mm and a 7mm height on US letter size sheet(s).
This would need you to generate a target and have the cgats and tiff file handy. Then open the target tiff file in photoshop to delete all the patches resulting in empty target. Then you have to measure the empty target to get page substrate "fingerprint". Then you would print the normal target and measure again to get normal color patches measurements.
The patchtool having spectral measurements from empty page, full normal page could build a hotmap of the empty patches having most variantion. A list of this hot mapped empty patches would then be used as base onto which patch color only spectrum (paper minus color) would be simulated.
So one can expect to instruct the application to push all the patches trough this list of hot mapped empty patches. This would produce optimized set of data for building profile without printing multiple targets with different scrambling and measuring errors and wasted paper and time.
I have explored variations due to various settings and the locations of patches of the same color as well as the paper white background. The former is a larger effect and the latter is not significant relative to other error sources.