You just said: "So now you're going to resort to lying and making up shit? Find WHERE I said "Solux is wrong". Nowhere. I said several of us have data which correlates well and doesn't match what Solux is specifying." and "by implying I'm saying the Solux data is wrong and I never said that.": So here is what you said in the first post on this thread: "This CCT4700K lamp, inserted within a Solux lamp housing by their design fails as it's off by CCT 451K."
I'm not implying anything. I'm providing you facts which you don't like, I'm providing you measured data from three sources. More of your semantic designed digressions.
OK, bring 'em on and explain how your and the others' measurements show that SoLux is wrong, oops, that SoLux fails. "I think not.": Show me SoLux fails in your measurements and then show that your measurements are valid; I have no problem with that whatsoever as I want to resolve this issue and the chips will fall where they may.
Here's the data for the three devices. HOW in any way will that change the data we provided? Answer: it will not. Yet the 2nd
digression you demand I go through in two posts in the last few hours
to keep you from answer the questions presented to you (again, how's that CIE article coming)? Where's YOUR data, or Solux's data their measurements are correct? Oh I forget, you don't have the means to provide data. Oh I forget, you did provide data which was meaningless. Where's the spec for accuracy of the device you used? Oh that's right, there IS NONE. It doesn't provide spectral data. Only took you a week to get that into your head.
i1Pro Hardware Specifications
SPECTRAL ENGINE
i1® technology with built-in wavelengths check
Spectral analyzer: Holographic diffraction grating with 128-pixel diode array
Spectral Range: 380 - 730 nm
Physical sampling interval: 3.5 nm
Optical resolution: 10 nm
Spectral reporting: 380 ... 730 nm in 10 nm steps
Measurement Frequency in scanning mode: 200 measurements per second
OPTICS
Measurement geometry: 45°/0° ring illumination optics, ISO 13655:2009
Measurement aperture: 4.5 mm (0.18”) diameter (effective measurement aperture during scanning is depending on the patch size and measurement speed)
Illumination Spot Size: 3.5 mm (0.14”)
Light source: Gas filled tungsten (illuminant type A) and UV LED
REFLECTANCE MEASUREMENT
Data Format: Spectral Reflectance [dimensionless]
Measurement Conditions:
UV included - ISO 13655:2009 measurement condition M0
D50 - ISO 13655:2009 measurement condition M1
UV excluded Filter - ISO 13655:2009 measurement condition M2
OBC: Optical Brightener Compensation (OBC) with i1Profiler software
Calibration: Manual on external ceramic white reference
Measurement Background: white, ISO 13655:2009; for measurements on backup board
Minimal Media Thickness: 3 mm (0.12”) on backup board
Minimal Patch Size in Scanning Mode: 7 x 10 mm (0.28” x 0.39”) (Width x Height) with sensor ruler 10 x 10 mm (0.39” x 0.39”) (Width x Height) without sensor ruler
Inter-instrument agreement: 0.4 ∆E94* average, 1.0 ∆E94* max. (deviation from X-Rite manufacturing standard at a temperature of 23ºC (73.4ºF) on 12 BCRA tiles (D50, 2º))
Short-term repeatability: 0.1 ∆E94* on white (D50,2°, mean of 10 measurements every 3 seconds on white)
EMISSIVE MEASUREMENT
Data format: Spectral radiance (mW/nm/m2 /sr); Luminance Y (cd/m2)
Measurement range: 0.2 - 1200 cd/m2 on a typical LCD-Monitor
Short-term repeatability: x,y: +/- 0.002 typical (5000°K, 80 cd/m2)
AMBIENT LIGHT MEASUREMENT
Data Format: spectral irradiance [mW/nm/m2], illuminance [lux]
Type: Cosine-corrected diffuse light measurement head
---------------------
PR-655
Detector 128 detector array
Spectroradiometer Wavelength Range 380 to 780 nm
Optics Pritchard optical system.
Digital Resolution 16 bits
Spectral Resolution 3.12 nm / pixel
Spectral bandwidth 8 nm (5 nm optional)
Spectral Accuracy ± 1 nm
Luminance Range 0.2 - 30,000 fL †
Luminance accuracy (Against NIST luminance standard) ± 2% *
Luminance repeatability ≤ 1% *
Color Accuracy (for Illuminant A) ±0.0015 in CIE 1931 x,y *Measurement Capabilities Luminance, Illuminance, luminous intensity, chromaticity, correlated color temperature, dominant wavelength.
Measurement Time 3 ms to 6000ms (6 secs)
AutoSync Range 20 to 400 Hz.
Battery Rechargeable Lithium-Ion. (≥ 12 hours continuous operation)
Weight 3.75 lbs (1.7 kg)
Operating Temperature 34° to 95° F (1° to 35° C)
-------------------
i1ProSpectral analyzer: Holographic diffraction grating with 128-pixel diode array
Optical resolution: 10nm
Physical sampling interval: 3.5nm
Spectral data: Range: 380 ... 730 nm in 10nm steps
Measurement aperture: 4.5mm diameter
Interface: USB 1.1
Physical dimensions: Length 151mm, width 66mm, height 67mm (6 x 2.6 x 2.6 inches)
Weight: 185g (6.5oz)
Accessories included: Calibration plate, USB cable, monitor holder, positioning target, scanning ruler, and light measurement head
Measurement geometry: 45°/0° ring illumination optics, DIN 5033
Light source: Gas filled tungsten (Type A)
Physical filters: No or UV cut (Filters not exchangeable)
Inter-instrument agreement: Average DE*94 0.4, max. DE*94 1.0 (Deviation from X-Rite manufacturing standard at 23°C for single measurement mode on 12 BCRA tiles (D50,2°)
Short-term repeatability: DE*94 <= 0.1 (D50,2°), with respect to the mean CIELab value of 10 measurements every 3 seconds on whiteData format: Spectral radiance (mW/nm/m2 /sr); Luminance Y (cd/m2)
Measurement range: 0.2 ... 300 cd/m2
Short-term repeatability: x,y: +/- 0.002 typical (CRT 5000°K, 80 cd/m2)
Type: Cosine-corrected diffuse light measurement head
Diameter: 6.0 mm
Although English is indeed my second language (or is it fourth after Dutch, French and German?), it looks to me like your use of the English language is getting more and more unprofessional, some would even say rude.
Yes, I'm rude and unprofessional. You've said that several times, I totally agree. In no way does that let you off the hook for your misunderstanding of colorimetry. It doesn't let you off the hook for using poor methodology. It doesn't let you off the hook in ignoring the CIE article that pokes holes in your concepts of display calibration. It doesn’t let you off the hook for saying our data is wrong.
What's the next rabbit hole you want to take us down as an attempt to ignore the mistakes you've made in print?