Thanks for the confirmation Graeme. I had a hard time wrapping my head around the notion of induced column defect, at the sensor level, in a CMOS sensor. The problem, if real as described, could lie elsewhere in the electronic chain. This guy sounds like a high level executive, with a business or law degree, who is crafting a compelling presentation, thanks to his smooth talking skills, based on misunderstood information... Quite frequent in those circles.